This presentation focuses on the technology that allows material analysis to be done out in the field, rather than in a lab. Traditionally, material analysis was done with bench-top spectrometers, however there is now unique and proprietary technology that has put discrete optical benches on silicon die. With the main optical components on a MEMS die, a spectrometer is now highly integrated, scalable, and reliable. What was once branded a bench-top device is now a portable spectral sensor enabling new applications for material analysis.